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ITC 2017

https://id.confref.org/data/confident/37075

This record is part of the confref event 48th IEEE International Test Conference.

rdf:typecf:Category_Event
schema:locationFort Worth (wd:Q16558)
rdfs:labelITC 2017
cf:Academic_Fieldhttps://id.confref.org/data/confident/25896
cf:AcronymITC 2017
cf:CityFort Worth
cf:Countryhttps://id.confref.org/data/confident/31086
cf:Country_Missingfalse
cf:Creation_date2023-04-04T08:14:34
cf:DOI10.25798/1848-zy82
cf:Display_TitleITC 2017
cf:End_Date2017-11-02
cf:Event_Modeon site
cf:Event_Statusas scheduled
cf:Has_Metricfalse
cf:Has_subobjecthttps://id.confref.org/data/confident/37075/788175af277ae8aa1481cc89b0d4908e
cf:Has_subobjecthttps://id.confref.org/data/confident/37075/bf6fe41c3b63b87a1c48d719c9b4670d
cf:In_Event_Serieshttps://id.confref.org/data/confident/1723
cf:Modification_date2023-08-04T08:49:37
cf:Month10
cf:Ordinal48
cf:Organizer_Missingfalse
cf:RegionTexas
cf:Single_Day_Eventno
cf:Start_Date2017-10-30
cf:Start_Date_Missingfalse
cf:Title48th IEEE International Test Conference
cf:Year2017
cf:pagehttps://www.confident-conference.org/index.php/Event:1950ec4e-5c72-4583-90e5-53045def6213
cf:pageTitleEvent:1950ec4e-5c72-4583-90e5-53045def6213
cr:disciplineelectrical engineering (wd:Q43035)
cr:fieldElectrical engineering, electronic engineering, information engineering (https://id.confref.org/data/oecd-fos/2.2)
cr:sameAswd:Q106431193
cr:sameAshttps://dblp.org/db/conf/itc/itc2017

Data: Turtle · JSON-LD · N-Triples · RDF/XML

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