Event Beta

48th IEEE International Test Conference

Name: 48th IEEE International Test Conference
Start: 2017-10-30
End: 2017-11-02
Location: Fort Worth

ITC 2017ITC

Date: 2017-10-30 to 2017-11-02
Place: Fort Worth, United States on the map
Series: International Test Conference, International Test Conference (ITC), IEEE International Test Conference, International Test Conference (ITC)
Attendance: on site
Status: as scheduled
Academic field: Natural sciences: Computer and information sciences
Engineering and technology: Electrical engineering, electronic engineering, information engineering
Disciplines: computer science, electrical engineering
Identifier: https://id.confref.org/event/e10hyjr

Proceedings

Title	DOI	Year	Record
IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017		2017	dblp

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc2017` · page
ConfIDent	`https://id.confref.org/data/confident/37075` · page
Wikidata	`http://www.wikidata.org/entity/Q106431193`
dblp	`https://dblp.org/db/conf/itc/itc2017`
GND	`https://d-nb.info/gnd/1161555056`

48th IEEE International Test Conference. confref identifier e10hyjr. https://id.confref.org/event/e10hyjr

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