Record Beta
Symposium/Workshop on Electronic Design, Test and Applications
https://id.confref.org/data/confref-portal/event/delta2008
This record is part of the confref event 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008.
| rdf:type | portal:Conference |
|---|---|
| schema:location | Hong Kong (wd:Q8646) |
| rdfs:label | Symposium/Workshop on Electronic Design, Test and Applications |
| portal:acronym | DELTA |
| portal:area | https://id.confref.org/data/confref-portal/area/2 |
| portal:city | Hong Kong |
| portal:country | Hong Kong |
| portal:endDate | 2008-01-01 |
| portal:name | Symposium/Workshop on Electronic Design, Test and Applications |
| portal:portalPage | http://portal.confref.org/list/delta2008 |
| portal:series | https://id.confref.org/data/confref-portal/series/delta |
| portal:startDate | 2008-01-01 |
| portal:submissionExtended | false |
| portal:year | 2008 |
| cr:discipline | computer science (wd:Q21198) |
| cr:field | Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2) |
| cr:sameAs | https://dblp.org/db/conf/delta/delta2008 |
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.