Record Beta
International Conference on Biometrics
https://id.confref.org/data/confref-portal/event/icb2017
This record is part of the confref event 2017 IEEE International Joint Conference on Biometrics, IJCB 2017, Denver, CO, USA, October 1-4, 2017.
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.