Event Beta

2017 IEEE International Joint Conference on Biometrics, IJCB 2017, Denver, CO, USA, October 1-4, 2017

Name: 2017 IEEE International Joint Conference on Biometrics, IJCB 2017, Denver, CO, USA, October 1-4, 2017
Start: 2017-10-01
End: 2017-10-04
Location: Denver

BTASICB

Date: 2017-10-01/04
Place: Denver, United States on the map
Series: International Conference on Biometrics, International Conference on Biometrics: Theory, Applications and Systems (BTAS)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e116qyx

Proceedings

Title	DOI	Year	Record
2017 IEEE International Joint Conference on Biometrics, IJCB 2017, Denver, CO, USA, October 1-4, 2017		2017	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/btas2017` · page `https://id.confref.org/data/confref-portal/event/icb2017` · page
dblp	`https://dblp.org/db/conf/icb/ijcb2017`

Cite

2017 IEEE International Joint Conference on Biometrics, IJCB 2017, Denver, CO, USA, October 1-4, 2017. confref identifier e116qyx. https://id.confref.org/event/e116qyx

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