Record Beta
IEEE Conference on Visual Analytics Science and Technology
https://id.confref.org/data/confref-portal/event/ieeevast2008
This record is part of the confref event 3rd IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2008, Columbus, OH, USA, October 19-24, 2008.
| rdf:type | portal:Conference |
|---|---|
| schema:location | Columbus (wd:Q16567) |
| rdfs:label | IEEE Conference on Visual Analytics Science and Technology |
| portal:acronym | IEEEVAST |
| portal:area | https://id.confref.org/data/confref-portal/area/2 |
| portal:city | Columbus |
| portal:country | USA |
| portal:endDate | 2008-10-24 |
| portal:name | IEEE Conference on Visual Analytics Science and Technology |
| portal:portalPage | http://portal.confref.org/list/ieeevast2008 |
| portal:series | https://id.confref.org/data/confref-portal/series/ieeevast |
| portal:startDate | 2008-10-19 |
| portal:submissionExtended | false |
| portal:year | 2008 |
| cr:discipline | computer science (wd:Q21198) |
| cr:field | Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2) |
| cr:sameAs | https://dblp.org/db/conf/ieeevast/ieeevast2008 |
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.