Event Beta

3rd IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2008, Columbus, OH, USA, October 19-24, 2008

Name: 3rd IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2008, Columbus, OH, USA, October 19-24, 2008
Start: 2008-10-19
End: 2008-10-24
Location: Columbus

IEEEVAST

Date: 2008-10-19/24
Place: Columbus, United States on the map
Series: IEEE Conference on Visual Analytics Science and Technology (VAST)
Edition: 3
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11bb5j

Proceedings

Title	DOI	Year	Record
3rd IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2008, Columbus, OH, USA, October 19-24, 2008		2008	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/ieeevast2008` · page
dblp	`https://dblp.org/db/conf/ieeevast/ieeevast2008`

Cite

3rd IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2008, Columbus, OH, USA, October 19-24, 2008. confref identifier e11bb5j. https://id.confref.org/event/e11bb5j

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