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International Test Conference (ITC)

https://id.confref.org/data/confref-portal/event/itc1993

This record is part of the confref event Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993.

rdf:typeportal:Conference
schema:locationBaltimore (wd:Q5092)
rdfs:labelInternational Test Conference (ITC)
portal:acronymITC
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:cityBaltimore
portal:countryUSA
portal:endDate1993-10-21
portal:nameInternational Test Conference (ITC)
portal:portalPagehttp://portal.confref.org/list/itc1993
portal:serieshttps://id.confref.org/data/confref-portal/series/itc
portal:startDate1993-10-17
portal:submissionExtendedfalse
portal:year1993
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAswd:Q106431222
cr:sameAshttps://dblp.org/db/conf/itc/itc1993

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