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Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993

Name: Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993
Start: 1993-10-17
End: 1993-10-21
Location: Baltimore

ITC 1993ITC

Date: 1993-10-17/21
Place: Baltimore, United States on the map
Series: International Test Conference, International Test Conference (ITC), International Test Conference (ITC)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hza8

Proceedings

Title	DOI	Year	Record
Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993		1993	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc1993` · page
Wikidata	`http://www.wikidata.org/entity/Q106431222`
dblp	`https://dblp.org/db/conf/itc/itc1993`
GND	`https://d-nb.info/gnd/5102629-6`

Cite

Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. confref identifier e10hza8. https://id.confref.org/event/e10hza8

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