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International Test Conference (ITC)

https://id.confref.org/data/confref-portal/event/itc1995

This record is part of the confref event Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995.

rdf:typeportal:Conference
schema:locationWashington, D.C. (wd:Q61)
rdfs:labelInternational Test Conference (ITC)
portal:acronymITC
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:cityWashington
portal:countryUSA
portal:endDate1995-10-25
portal:nameInternational Test Conference (ITC)
portal:portalPagehttp://portal.confref.org/list/itc1995
portal:serieshttps://id.confref.org/data/confref-portal/series/itc
portal:startDate1995-10-21
portal:submissionExtendedfalse
portal:year1995
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAswd:Q106431220
cr:sameAshttps://dblp.org/db/conf/itc/itc1995

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