Event Beta

Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995

Name: Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995
Start: 1995-10-21
End: 1995-10-25
Location: Washington, D.C.

ITC 1995ITC

Date: 1995-10-21/25
Place: Washington, D.C., United States on the map
Series: International Test Conference, International Test Conference (ITC), International Test Conference (ITC)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hz8c

Proceedings

Title	DOI	Year	Record
Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995		1995	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc1995` · page
Wikidata	`http://www.wikidata.org/entity/Q106431220`
dblp	`https://dblp.org/db/conf/itc/itc1995`
GND	`https://d-nb.info/gnd/5175207-4`

Cite

Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. confref identifier e10hz8c. https://id.confref.org/event/e10hz8c

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