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International Test Conference (ITC)

https://id.confref.org/data/confref-portal/event/itc2008

This record is part of the confref event 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008.

rdf:typeportal:Conference
schema:locationSanta Clara (wd:Q159260)
rdfs:labelInternational Test Conference (ITC)
portal:acronymITC
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:citySanta Clara
portal:countryUSA
portal:endDate2008-10-31
portal:nameInternational Test Conference (ITC)
portal:portalPagehttp://portal.confref.org/list/itc2008
portal:serieshttps://id.confref.org/data/confref-portal/series/itc
portal:startDate2008-10-26
portal:submissionExtendedfalse
portal:year2008
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAswd:Q106431203
cr:sameAshttps://dblp.org/db/conf/itc/itc2008

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