Event Beta

2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008

Name: 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008
Start: 2008-10-26
End: 2008-10-31
Location: Santa Clara

ITC 2008ITC

Date: 2008-10-26/31
Place: Santa Clara, United States on the map
Series: International Test Conference, International Test Conference (ITC), International Test Conference (ITC)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hyv6

Proceedings

Title	DOI	Year	Record
2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008		2008	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc2008` · page
Wikidata	`http://www.wikidata.org/entity/Q106431203`
dblp	`https://dblp.org/db/conf/itc/itc2008`
GND	`https://d-nb.info/gnd/16008090-3`

Cite

2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. confref identifier e10hyv6. https://id.confref.org/event/e10hyv6

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