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International Test Conference (ITC)

https://id.confref.org/data/confref-portal/event/itc2016

This record is part of the confref event 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016.

rdf:typeportal:Conference
schema:locationFort Worth (wd:Q16558)
rdfs:labelInternational Test Conference (ITC)
portal:acronymITC
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:cityFort Worth
portal:countryUSA
portal:endDate2016-11-17
portal:keywordAccess control
portal:keywordAttack Tree
portal:keywordAttacks
portal:keywordBall-Grid-Array (BGA)
portal:keywordBitcoin
portal:keywordBlockchain
portal:keywordBytecode dissassembly
portal:keywordBytecode infection
portal:keywordCPLD
portal:keywordCPython
portal:keywordCloud computing
portal:keywordCode-based cryptography
portal:keywordCommon factor
portal:keywordCompression function
portal:keywordCountermeasures
portal:keywordCryptocurrency
portal:keywordDecapsulation
portal:keywordFPGA
portal:keywordSecurity
portal:keywordapplications
portal:nameInternational Test Conference (ITC)
portal:portalPagehttp://portal.confref.org/list/itc2016
portal:serieshttps://id.confref.org/data/confref-portal/series/itc
portal:startDate2016-11-15
portal:submissionExtendedfalse
portal:year2016
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAswd:Q106431194
cr:sameAshttps://dblp.org/db/conf/itc/itc2016

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