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Memory Technology, Design and Testing

https://id.confref.org/data/confref-portal/event/mtdt2002

This record is part of the confref event 10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France.

rdf:typeportal:Conference
schema:locationFrance (wd:Q142)
rdfs:labelMemory Technology, Design and Testing
portal:acronymMTDT
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:cityIsle of Bendor
portal:countryFrance
portal:endDate2002-07-12
portal:nameMemory Technology, Design and Testing
portal:portalPagehttp://portal.confref.org/list/mtdt2002
portal:serieshttps://id.confref.org/data/confref-portal/series/mtdt
portal:startDate2002-07-10
portal:submissionExtendedfalse
portal:year2002
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAshttps://dblp.org/db/conf/mtdt/mtdt2002

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