Event Beta

10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France

Name: 10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France
Start: 2002-07-10
End: 2002-07-12
Location: France

MTDT

Date: 2002-07-10/12
Place: France
Series: Memory Technology, Design and Testing (MTDT)
Edition: 10
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11kgbg

Proceedings

Title	DOI	Year	Record
10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France		2002	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/mtdt2002` · page
dblp	`https://dblp.org/db/conf/mtdt/mtdt2002`

Cite

10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France. confref identifier e11kgbg. https://id.confref.org/event/e11kgbg

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