Event Beta

2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006

Name: 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006
Start: 2006-10-22
End: 2006-10-27
Location: Santa Clara

ITC 2006ITC

Date: 2006-10-22/27
Place: Santa Clara, United States on the map
Series: International Test Conference, International Test Conference (ITC), International Test Conference (ITC)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hyx2

Proceedings

Title	DOI	Year	Record
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006		2006	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc2006` · page
Wikidata	`http://www.wikidata.org/entity/Q106431205`
dblp	`https://dblp.org/db/conf/itc/itc2006`
GND	`https://d-nb.info/gnd/6067305-9`

Cite

2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. confref identifier e10hyx2. https://id.confref.org/event/e10hyx2

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