Event Beta

Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996

Name: Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996
Start: 1996-10-20
End: 1996-10-25
Location: Washington, D.C.

ITC 1996ITC

Date: 1996-10-20/25
Place: Washington, D.C., United States on the map
Series: International Test Conference, International Test Conference (ITC), International Test Conference (ITC)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hz7e

Proceedings

Title	DOI	Year	Record
Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996		1996	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc1996` · page
Wikidata	`http://www.wikidata.org/entity/Q106431219`
dblp	`https://dblp.org/db/conf/itc/itc1996`
GND	`https://d-nb.info/gnd/5244583-5`

Cite

Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. confref identifier e10hz7e. https://id.confref.org/event/e10hz7e

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