Event Beta
33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015
VTS
- Date
- 2015-04-27/29
- Place
- Napa, United States on the map
- Series
- IEEE VLSI Test Symposium (VTS)
- Edition
- 33
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e11ynzc
Proceedings
| Title | DOI | Year | Record |
|---|---|---|---|
| 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015 | 2015 | dblp |
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| confref portal (2020) | |
|---|---|
| dblp |
Cite
33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. confref identifier e11ynzc. https://id.confref.org/event/e11ynzc
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