Event Beta
International Conference on Microelectronic Test Structures 2023
ICMTS 2023
- Date
- 2023-03-27/30
- Place
- Tokyo, Japan on the map
- Series
- International Conference on Microelectronic Test Structures
- Edition
- 35
- Attendance
- on site
- Status
- as scheduled
- Website
- http://icmts.if.t.u-tokyo.ac.jp/icmts.if.t.u-tokyo.ac.jp_8080/index.html
- Academic field
- Engineering and technology: Electrical engineering, electronic engineering, information engineering
- Disciplines
- microelectronics
- Identifier
https://id.confref.org/event/e12c8b6
Sources
The records of the sources that this identifier brings together (cr:sameAs).
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Cite
International Conference on Microelectronic Test Structures 2023. confref identifier e12c8b6. https://id.confref.org/event/e12c8b6
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.